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NUMBER C21005
AUTHOR Kim, Jaewan,Sohbi, Adel
TITLE Certifying dimension of quantum systems by sequential projective measurements
ARCHIVE https://arxiv.org/abs/2102.04608
FILE  
JOURNAL QUANTUM, 2021
ABSTRACT This work analyzes correlations arising from quantum systems subject to sequential projective measurements to certify that the system in question has a quantum dimension greater than some d. We refine previous known methods and show that dimension greater than two can be certified in scenarios which are considerably simpler than the ones presented before and, for the first time in this sequential projective scenario, we certify quantum systems with dimension strictly greater than three. We also perform a systematic numerical analysis in terms of robustness and conclude that performing random projective measurements on random pure qutrit states allows a robust certification of quantum dimensions with very high probability.
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